Model: XB-100

Analytical Probe Station

Specification

Vacuum Chuck 4" 

Coaxial-Driven Chuck Stage 

Chuck stage 4"×4" Travel 

Chuck Theta 0°~30°

Chuck Up/Down 4mm Adjustable

Microscope Stage 2"×2" Travel

580mmW x 460mmD x 700mmH With Microscope

Weight 55kg with microscope

Accessories

Microscope Magnification：1000X

Hot Chuck：200/300/400℃

Special Chuck Design for RF

CCD and Screen

Micropositioner

Tip Holder

Shielding Box

Vibration Free Table

The Probe Station XB-100 is a dedicated probing solution that comes with everything you need to achieve accurate measurement results in the shortest time, with maximum confidence. The system provides best known methods for I-V/C-V measurements.

Designed for upgradability and extendable with multiple options. The Probe Station XT-100 can be easily reconfigured to meet your future project requirements, such as RF testing and high voltage testing .